The Annual Meeting of STK 2010 was held on June 16th, 2010 at Sika in Sarnen and was mainly focused on Polymer and Material Characterization using TA-Techniques.

Scientific Committee

List point
  • Jean-Nicolas AEBISCHER, EIF, Fribourg
  • Rolf HILFIKER, Solvias AG, Basel
  • Siegfried KRIMMER, Roche, Basel
  • Gerhard LEU, Sika Technology AG, Zürich
  • Alois RAEMY, Nestlé SA Lausanne
  • Rudolf RIESEN, Mettler-Toledo, Schwerzenbach
  • Françis STOESSEL, Swiss Safety Institute, Basel
  • Benoît ZUFFEREY, Firmenich, La Plaine Genève


List point
  • Mettler Toledo
  • ChemiSens
  • TA Instruments
  • Setaram